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DC Field | Value | Language |
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dc.contributor.author | Soethe, Viviane Lilian | pt_BR |
dc.contributor.author | Nohara, Evandro Luis | pt_BR |
dc.contributor.author | Fontana, Luis César | pt_BR |
dc.contributor.author | Rezende, Mirabel Cerqueira | pt_BR |
dc.date.accessioned | 2019-09-12T16:32:36Z | - |
dc.date.available | 2019-09-12T16:32:36Z | - |
dc.date.issued | 2011 | - |
dc.citation.volume | 3 | pt_BR |
dc.citation.issue | 3 | pt_BR |
dc.citation.spage | 279 | - |
dc.citation.epage | 286 | - |
dc.identifier.doi | 10.5028/jatm.2011.03030511 | pt_BR |
dc.identifier.issn | 2175-9146 | - |
dc.identifier.uri | http://repositorio.unitau.br/jspui/handle/20.500.11874/1940 | - |
dc.description.abstract | Abstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties. | en |
dc.description.provenance | Made available in DSpace on 2019-09-12T16:32:36Z (GMT). No. of bitstreams: 0 Previous issue date: 2011 | en |
dc.language | Inglês | pt_BR |
dc.publisher | Departamento de Ciência e Tecnologia Aeroespacial | - |
dc.publisher.country | Brasil | pt_BR |
dc.relation.ispartof | Journal of Aerospace Technology and Management | - |
dc.rights | Acesso Aberto | pt_BR |
dc.rights.uri | https://creativecommons.org/licenses/by-nc-nd/4.0 | * |
dc.source | Scielo | pt_BR |
dc.subject.other | Radar absorbing material | en |
dc.subject.other | Magnetron sputtering | en |
dc.subject.other | Thin film | en |
dc.subject.other | Titanium | en |
dc.title | Radar absorbing materials based on titanium thin film obtained by sputtering technique | en |
dc.type | Artigo de Periódico | pt_BR |
dc.contributor.orcid | Rezende, Mirabel https://orcid.org/0000-0002-3735-8765 | pt_BR |
dc.contributor.researcherid | Rezende, Mirabel/D-9827-2013 | pt_BR |
dc.description.affiliation | [Rezende, Mirabel Cerqueira] Institute of Aeronautics and Space, Brazil | - |
dc.description.affiliation | Fontana, Luis César] Universidade do Estado de Santa Catarina, Brazil | - |
dc.description.affiliation | Soethe, Viviane Lilian] Technological Institute of Aeronautics, Brazil | - |
dc.description.affiliation | Nohara, Evandro Luis] Universidade de Taubaté, Brazil | - |
dc.subject.researcharea | Engineering | en |
dc.subject.scieloarea | Engineering, Aerospace | en |
dc.identifier.scielo | SCIELO:S2175-91462011000300279 | - |
Appears in Collections: | Artigos de Periódicos |
Files in This Item:
File | Size | Format | |
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SCIELO S2175-91462011000300279.pdf | 2.06 MB | Adobe PDF | View/Open |
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