Please use this identifier to cite or link to this item: http://repositorio.unitau.br/jspui/handle/20.500.11874/1940
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dc.contributor.authorSoethe, Viviane Lilianpt_BR
dc.contributor.authorNohara, Evandro Luispt_BR
dc.contributor.authorFontana, Luis Césarpt_BR
dc.contributor.authorRezende, Mirabel Cerqueirapt_BR
dc.date.accessioned2019-09-12T16:32:36Z-
dc.date.available2019-09-12T16:32:36Z-
dc.date.issued2011-
dc.citation.volume3pt_BR
dc.citation.issue3pt_BR
dc.citation.spage279-
dc.citation.epage286-
dc.identifier.doi10.5028/jatm.2011.03030511pt_BR
dc.identifier.issn2175-9146-
dc.identifier.urihttp://repositorio.unitau.br/jspui/handle/20.500.11874/1940-
dc.description.abstractAbstract: Titanium thin films with nanometer thicknesses were deposited on polyethylene terephthalate (PET) substrate using the triode magnetron sputtering technique. It was observed that the titanium thin film-polymeric substrate set attenuates the energy of the incident electromagnetic wave in the frequency range of 8 to 12 GHz. This result allows to consider this set as a radar absorbing material, which may be employed in automobile, telecommunication, aerospace, medical, and electroelectronic areas. Results of the reflectivity show that the attenuation depends on the thin film thickness, as a determining factor. Thin films with 25 to 100 nm thickness values show attenuation of the electromagnetic wave energy from around 20 to 50%. Analyses by Rutherford backscattering spectrometry provided information about the thickness of the thin films studied. Hall effect analyses contributed to better understand the influence of the thin film thickness on the electron mobility and consequently on absorption properties.en
dc.description.provenanceMade available in DSpace on 2019-09-12T16:32:36Z (GMT). No. of bitstreams: 0 Previous issue date: 2011en
dc.languageInglêspt_BR
dc.publisherDepartamento de Ciência e Tecnologia Aeroespacial-
dc.publisher.countryBrasilpt_BR
dc.relation.ispartofJournal of Aerospace Technology and Management-
dc.rightsAcesso Abertopt_BR
dc.rights.urihttps://creativecommons.org/licenses/by-nc-nd/4.0*
dc.sourceScielopt_BR
dc.subject.otherRadar absorbing materialen
dc.subject.otherMagnetron sputteringen
dc.subject.otherThin filmen
dc.subject.otherTitaniumen
dc.titleRadar absorbing materials based on titanium thin film obtained by sputtering techniqueen
dc.typeArtigo de Periódicopt_BR
dc.contributor.orcidRezende, Mirabel https://orcid.org/0000-0002-3735-8765pt_BR
dc.contributor.researcheridRezende, Mirabel/D-9827-2013pt_BR
dc.description.affiliation[Rezende, Mirabel Cerqueira] Institute of Aeronautics and Space, Brazil-
dc.description.affiliationFontana, Luis César] Universidade do Estado de Santa Catarina, Brazil-
dc.description.affiliationSoethe, Viviane Lilian] Technological Institute of Aeronautics, Brazil-
dc.description.affiliationNohara, Evandro Luis] Universidade de Taubaté, Brazil-
dc.subject.researchareaEngineeringen
dc.subject.scieloareaEngineering, Aerospaceen
dc.identifier.scieloSCIELO:S2175-91462011000300279-
Appears in Collections:Artigos de Periódicos

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