Please use this identifier to cite or link to this item: http://repositorio.unitau.br/jspui/handle/20.500.11874/2465
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dc.contributor.authorFerreira Jr. A.A.pt_BR
dc.contributor.authorDo Amaral Pereira W.N.pt_BR
dc.contributor.authorRibeiro J.A.J.pt_BR
dc.date.accessioned2019-09-12T16:53:19Z-
dc.date.available2019-09-12T16:53:19Z-
dc.date.issued2008-
dc.citation.volume47pt_BR
dc.citation.issue1pt_BR
dc.identifier.issn7452993-
dc.identifier.urihttps://www.scopus.com/inward/record.uri?eid=2-s2.0-44449176765&partnerID=40&md5=872696285ac403fb935864b134cd5cd3-
dc.identifier.urihttp://repositorio.unitau.br/jspui/handle/20.500.11874/2465-
dc.description.abstract[No abstract available]en
dc.description.provenanceMade available in DSpace on 2019-09-12T16:53:19Z (GMT). No. of bitstreams: 0 Previous issue date: 2008en
dc.languageInglêspt_BR
dc.relation.ispartofMicrowaves and RF-
dc.rightsAcesso Restritopt_BR
dc.sourceScopuspt_BR
dc.titleDetermine twisted-line characteristic impedanceen
dc.typeArtigo de Periódicopt_BR
dc.description.affiliationFerreira Jr., A.A., Electronic and Electrotechnical Department, National Telecommunications Institute (INATEL), 510 João de Camargo Ave., 37540-000, Santa Rita do Sapucaí, Minas Gerais, Brazil-
dc.description.affiliationDo Amaral Pereira, W.N., Telecommunication Department, National Telecommunications Institute (INATEL), 510 João de Camargo Ave., 37540-000, Santa Rita do Sapucaí, Minas Gerais, Brazil-
dc.description.affiliationRibeiro, J.A.J., Electrical Engineering Department, University of Taubate (UNITAU), s/n Daniel Danelli St., 12060-440, Taubate, Sao Paulo, Brazil-
dc.identifier.scopus2-s2.0-44449176765-
dc.contributor.scopus7402999847pt_BR
dc.contributor.scopus15841384000pt_BR
dc.contributor.scopus24336341500pt_BR
Appears in Collections:Artigos de Periódicos

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